Open AccessUltrafast Electron Microscopy for Spatial-Temporal Mapping of Charge Carriers
Author(s) -
C.Y. Nakakura,
Scott Ellis,
Kim Celio,
Eric J. Smoll,
David W. Chandler,
Joseph R. Michael
Publication year - 2021
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1828105
Subject(s) - ultrashort pulse , microelectronics , detector , usability , throughput , noise (video) , optics , computer science , materials science , optoelectronics , laser , physics , artificial intelligence , telecommunications , wireless , image (mathematics) , human–computer interaction
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