Open AccessReliability Prediction using FMEA, FTA, and Related Techniques [Slides]
Author(s) -
David Collins,
Aparna V. Huzurbazar
Publication year - 2021
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1813832
Subject(s) - reliability (semiconductor) , reliability engineering , computer science , failure mode and effects analysis , engineering , power (physics) , physics , quantum mechanics
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