Open AccessOptical Characterization of Defects in High-efficiency (Ag, Cu)(In, Ga)Se2
Author(s) -
Siming Li,
Rouin Farshchi,
Michael Miller,
Aaron R. Arehart,
Darius Kuciauskas
Publication year - 2020
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.2172/1808862
Subject(s) - photoluminescence , recombination , deep level transient spectroscopy , spectroscopy , materials science , doping , optoelectronics , carrier lifetime , band gap , diffusion , characterization (materials science) , analytical chemistry (journal) , molecular physics , silicon , chemistry , nanotechnology , physics , quantum mechanics , gene , thermodynamics , chromatography , biochemistry
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