Open AccessAdvanced CMOS Reliability Update: Sub 20nm FinFET Assessment
Author(s) -
Jeremy A. Walraven,
M. King,
Robert Kaplar,
Gad Haase,
Thomas A. Grzybowski
Publication year - 2020
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/1779710
Subject(s) - transistor , materials science , optoelectronics , leakage (economics) , cmos , reliability (semiconductor) , hot carrier injection , short channel effect , integrated circuit , electrical engineering , mosfet , nanotechnology , engineering , voltage , physics , power (physics) , quantum mechanics , economics , macroeconomics
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