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Measuring the Diffraction Properties of an Imaging Quartz(211) Crystal
Author(s) -
M. J. Haugh,
K. D. Jacoby,
Hui Chen,
K. W. Hill,
M Schneider
Publication year - 2015
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1756306
Subject(s) - goniometer , crystal (programming language) , spectrometer , optics , resolution (logic) , materials science , diffraction , quartz , dispersion (optics) , bent molecular geometry , analytical chemistry (journal) , physics , chemistry , chromatography , artificial intelligence , computer science , composite material , programming language

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