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High-Yield X-ray Photocathodes for Next-Generation Imaging Detectors
Author(s) -
Y. P. Opachich,
Jeffrey A. Koch,
P. W. Ross,
Kathy Opachich,
P. M. Bell,
D. K. Bradley,
Naheng Chen,
Jun Feng,
Arun Gopal,
T. J. Hilsabeck,
O. L. Landen,
A. G. MacPhee,
S. R. Nagel,
S. Udin
Publication year - 2016
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/1755232
Subject(s) - yield (engineering) , detector , x ray detector , physics , x ray , optics , materials science , optoelectronics , thermodynamics

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