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Talbot-Lau X-Ray Deflectometry with Flash X-Ray Sources for Density Measurements in Dynamic Experiments
Author(s) -
Daniel Clayton,
David Schwellenbach,
Craig Kruschwitz
Publication year - 2017
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.2172/1734878
Subject(s) - image resolution , flash (photography) , x ray , optics , resolution (logic) , electron density , physics , electron , computer science , artificial intelligence , quantum mechanics

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