Assessment of AFM - KPFM and SSRM for Measuring and Characterizing Materials Aging Processes
Author(s) -
Ana Baca
Publication year - 2020
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1733233
Subject(s) - atomic force microscopy , materials science , nanotechnology
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