Open AccessMOCVD Growth and Characterization of Wide Bandgap ZnGeN<sub>2</sub> Thin Films
Author(s) -
Md Rezaul Karim,
Benthara Hewage Dinushi Jayatunga,
Zixuan Feng,
Menglin Zhu,
Jinwoo Hwang,
K. Kash,
Hongping Zhao
Publication year - 2020
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.2172/1677506
Subject(s) - wurtzite crystal structure , materials science , band gap , metalorganic vapour phase epitaxy , thin film , orthorhombic crystal system , chemical vapor deposition , sapphire , scanning electron microscope , optoelectronics , analytical chemistry (journal) , epitaxy , crystallography , crystal structure , nanotechnology , optics , chemistry , zinc , laser , layer (electronics) , physics , chromatography , metallurgy , composite material
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