
Study of inner-shell vacancy cascades by coincidence techniques
Author(s) -
Thomas W. LeBrun,
Uwe Arp,
M. J. MacDonald,
S. H. Southworth
Publication year - 1995
Language(s) - English
Resource type - Reports
DOI - 10.2172/166504
Subject(s) - auger , atomic physics , photoionization , auger effect , vacancy defect , spectral line , core electron , electron , excited state , auger electron spectroscopy , atom (system on chip) , chemistry , excitation , electron shell , argon , physics , ionization , ion , nuclear physics , organic chemistry , quantum mechanics , astronomy , computer science , embedded system , crystallography