Complexities of Contact Potential Difference Measurements on Metal Halide Perovskite Surfaces
Author(s) -
Fengyu Zhang,
Florian Ullrich,
Scott Silver,
Ross A. Kerner,
Barry P. Rand,
Antoine Kahn
Publication year - 2019
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.2172/1659409
Subject(s) - kelvin probe force microscope , volta potential , surface photovoltage , x ray photoelectron spectroscopy , photoelectric effect , materials science , perovskite (structure) , work function , fermi level , inverse photoemission spectroscopy , band bending , optoelectronics , photoemission spectroscopy , spectroscopy , chemistry , metal , electron , nanotechnology , atomic force microscopy , physics , crystallography , metallurgy , quantum mechanics , nuclear magnetic resonance
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