Open AccessSystem-Independent X-Ray Characterization
Author(s) -
Steve Glenn
Publication year - 2020
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/1643780
Subject(s) - effective atomic number , characterization (materials science) , projection (relational algebra) , attenuation , atomic number , energy (signal processing) , standard deviation , decomposition , computational physics , physics , materials science , mathematics , algorithm , optics , chemistry , statistics , atomic physics , organic chemistry
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