Open AccessMaterials Characterization Techniques Lecture Series: X-Ray Diffraction, A Summary of LANL's Materials Capabilities in MPA-11 [Slides]
Author(s) -
Stefan Williams,
Tommy Rockward
Publication year - 2020
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1633561
Subject(s) - diffraction , diffractometer , sample (material) , x ray crystallography , materials science , sample preparation , phase (matter) , powder diffraction , characterization (materials science) , crystallography , analytical chemistry (journal) , computer science , nanotechnology , optics , physics , chemistry , scanning electron microscope , chromatography , composite material , quantum mechanics
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