Open AccessDegradation and Reliability Advancements in Tubular SOFC
Author(s) -
Praveen Cheekatamarla
Publication year - 2020
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1617198
Subject(s) - anode , degradation (telecommunications) , cathode , reliability (semiconductor) , materials science , sintering , electrolyte , layer (electronics) , interconnection , scope (computer science) , process engineering , computer science , metallurgy , nanotechnology , electrical engineering , engineering , chemistry , electrode , telecommunications , power (physics) , physics , quantum mechanics , programming language
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