Open AccessNDE Reliability Issues for the Examination of CASS Components
Author(s) -
Richard E. Jacob,
Susan L. Crawford,
Traci L. Moran,
Michael R. Larche,
Matthew S. Prowant,
Aaron A. Diaz,
Carol Nove
Publication year - 2019
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1564083
Subject(s) - reliability (semiconductor) , reliability engineering , computer science , engineering , physics , power (physics) , quantum mechanics
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