z-logo
open-access-imgOpen Access
Novel Applications of Scanning Ultrafast Electron Microscopy (SUEM)
Author(s) -
C.Y. Nakakura,
Kimberlee Chiyoko Celio,
Joseph R. Michael,
Jeffry J. Sniegowski,
Joachim H. Clement,
David W. Chandler,
A. Alec Talin
Publication year - 2019
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/1564040
Subject(s) - ultrashort pulse , scanning electron microscope , scanning confocal electron microscopy , materials science , microscopy , nanotechnology , electron microscope , optics , physics , composite material , laser

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom