Open AccessOptimization of SiV Defect Yield in Diamond Substrates
Author(s) -
Edward S. Bielejec,
John Abraham,
Daniel Perry
Publication year - 2019
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1562424
Subject(s) - diamond , materials science , ion implantation , optoelectronics , quantum yield , ion beam , leverage (statistics) , ion , nanotechnology , engineering physics , optics , computer science , beam (structure) , physics , artificial intelligence , composite material , quantum mechanics , fluorescence
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