Structural Changes of Self-Assembled Leas Sulfide, Polystyrene Thin Films Under Extreme Pressure Using in-situ High Pressure Small Angle X-ray Scattering | Zendy

Mark Pepple | Zendy; Joshua Hill | Zendy

Open Access

Structural Changes of Self-Assembled Leas Sulfide, Polystyrene Thin Films Under Extreme Pressure Using in-situ High Pressure Small Angle X-ray Scattering

Author(s) -

Mark Pepple,

Joshua Hill

Publication year - 2014

Publication title -

osti oai (u.s. department of energy office of scientific and technical information)

Language(s) - English

Resource type - Reports

DOI - 10.2172/1561684

Subject(s) - small angle x ray scattering , evaporation , scattering , mesophase , radius , particle (ecology) , materials science , nanoparticle , range (aeronautics) , oxide , polystyrene , crystallography , particle size , chemical engineering , chemical physics , analytical chemistry (journal) , chemistry , nanotechnology , optics , composite material , thermodynamics , organic chemistry , polymer , liquid crystal , oceanography , engineering , metallurgy , physics , optoelectronics , geology , computer security , computer science

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