Open AccessCorrelation of Qualification and Accelerated Testing with Field Degradation
Author(s) -
GovindaSamy TamizhMani,
Dirk Jordan,
Hamsini Gopalakrishna,
Archana Sinha,
Arun Balasubramaniyan,
Jaewon Oh,
Kshitiz Dolia
Publication year - 2018
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1561276
Subject(s) - degradation (telecommunications) , field (mathematics) , statistics , reliability engineering , mathematics , engineering , electrical engineering , pure mathematics
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