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Back side defect imaging in crystalline silicon photovoltaic modules
Author(s) -
Mihail Bora
Publication year - 2019
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1544491
Subject(s) - common emitter , depreciation (economics) , wafer , photovoltaic system , crystalline silicon , materials science , business , capital cost , electricity , silicon , optoelectronics , electrical engineering , industrial organization , commerce , engineering , economics , capital formation , human capital , financial capital , economic growth

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