Grain Boundary Diffusion Characterized by KPFM
Author(s) -
Ana Baca,
Michael T. Brumbach,
Paul T. Vianco,
Pat Patterson,
David Scrymgeour
Publication year - 2018
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/1528815
Subject(s) - kelvin probe force microscope , auger electron spectroscopy , x ray photoelectron spectroscopy , grain boundary , diffusion , nanometre , materials science , reliability (semiconductor) , analytical chemistry (journal) , nanotechnology , optoelectronics , chemistry , atomic force microscopy , chemical engineering , composite material , microstructure , power (physics) , physics , engineering , thermodynamics , chromatography , quantum mechanics , nuclear physics
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