Open AccessIR Imaging of PDMS Degradation Thin Films on Metal Surfaces.
Author(s) -
Todd M. Alam
Publication year - 2019
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1495429
Subject(s) - degradation (telecommunications) , materials science , metal , thin film , chemical engineering , nanotechnology , metallurgy , computer science , engineering , telecommunications
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