Open AccessNovel Applications of Near-Field Scanning Optical Microscopy (NSOM)
Author(s) -
C.Y. Nakakura,
Aaron M. Katzenmeyer,
David Scrymgeour,
Jeffry J. Sniegowski,
Joachim H. Clement
Publication year - 2018
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/1475250
Subject(s) - near field scanning optical microscope , optical microscope , materials science , microscopy , optics , polishing , laser , resolution (logic) , optoelectronics , scanning electron microscope , physics , computer science , artificial intelligence , composite material
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