X-Ray Diffraction Measurements on Laser-Compressed Polycrystalline Samples Using a Short-Pulse Laser Generated X-Ray Source.
Author(s) -
Marius Schollmeier,
Ella Field,
Benjamin Galloway,
Mark Kimmel,
Patrick K. Rambo,
Jens Schwarz,
Tommy Ao,
Patricia Kalita,
Christopher T Seagle,
Dane Morgan,
Joel Long
Publication year - 2018
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1474265
Subject(s) - diffraction , laser , optics , materials science , nanosecond , fluence , physics
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