Open AccessLDRD Report : Analysis of Defect Clustering in Semiconductors using Kinetic Monte Carlo Methods
Author(s) -
Brian Douglas Hehr
Publication year - 2014
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1465520
Subject(s) - materials science , kinetic monte carlo , annealing (glass) , dopant , silicon , semiconductor , monte carlo method , irradiation , transistor , silicon on insulator , band gap , optoelectronics , semiconductor device , doping , nuclear engineering , nanotechnology , nuclear physics , physics , statistics , mathematics , quantum mechanics , voltage , layer (electronics) , composite material , engineering
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