Open AccessThe Determination of Radiation Hardness of Semiconductor Materials and Devices with Ion Beams
Author(s) -
Željko Pastuović,
Rainer Siegele,
György Vizkelethy,
M. Jakšić,
Veljko Grilj,
N. Skukan,
J. Garcı́a López,
Carmen Jimenez Ramos,
E. Vittone
Publication year - 2017
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1436059
Subject(s) - semiconductor , radiation hardening , characterization (materials science) , engineering physics , semiconductor device , computer science , radiation , materials science , radiation damage , nanotechnology , systems engineering , optoelectronics , physics , engineering , nuclear physics , layer (electronics)
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