Open AccessAdvanced SOFC quality control and the role of manufacturing defects on stack reliability
Author(s) -
Wensheng Wang
Publication year - 2018
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1430240
Subject(s) - reliability (semiconductor) , reliability engineering , stack (abstract data type) , scope (computer science) , quality (philosophy) , production (economics) , computer science , engineering , process engineering , power (physics) , philosophy , physics , epistemology , quantum mechanics , economics , macroeconomics , programming language
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