z-logo
open-access-imgOpen Access
Optical-based spectroscopic methods for measuring chemical, optical, and physical properties of thin polymer waveguide films
Author(s) -
Jonathan M. Bobbitt
Publication year - 2017
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1417984
Subject(s) - materials science , waveguide , raman spectroscopy , refractive index , polystyrene , polymer , thin film , methyl methacrylate , optics , poly(methyl methacrylate) , optoelectronics , analytical chemistry (journal) , nanotechnology , copolymer , chemistry , composite material , physics , chromatography

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom