Optical-based spectroscopic methods for measuring chemical, optical, and physical properties of thin polymer waveguide films
Author(s) -
Jonathan M. Bobbitt
Publication year - 2017
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1417984
Subject(s) - materials science , waveguide , raman spectroscopy , refractive index , polystyrene , polymer , thin film , methyl methacrylate , optics , poly(methyl methacrylate) , optoelectronics , analytical chemistry (journal) , nanotechnology , copolymer , chemistry , composite material , physics , chromatography
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom