Open AccessCoupled Thermo-Mechanical and Photo-Chemical Degradation Mechanisms that determine the Reliability and Operational Lifetimes for CPV Technologies
Author(s) -
Reinhold H. Dauskardt
Publication year - 2017
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1399517
Subject(s) - degradation (telecommunications) , reliability (semiconductor) , photodegradation , materials science , silicone , computer science , chemistry , composite material , physics , telecommunications , photocatalysis , power (physics) , biochemistry , quantum mechanics , catalysis
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