Compact Models for Defect Diffusivity in Semiconductor Alloys.
Author(s) -
Alan Wright,
Normand A. Modine,
Stephen Lee,
Stephen M. Foiles
Publication year - 2017
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1395644
Subject(s) - materials science , semiconductor , transient (computer programming) , radiation , diffusion , radiation hardening , crystallographic defect , alloy , thermal diffusivity , optoelectronics , semiconductor device , irradiation , neutron , computational physics , nuclear engineering , computer science , condensed matter physics , physics , optics , nanotechnology , nuclear physics , thermodynamics , composite material , engineering , layer (electronics) , operating system
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