Open AccessIn situ transmission electron microscopy study of the microstructural origins for the electric field-induced phenomena in ferroelectric perovskites
Author(s) -
Hanzheng Guo
Publication year - 2014
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1342570
Subject(s) - ferroelectricity , materials science , electric field , piezoelectricity , dielectric , piezoresponse force microscopy , poling , ferroelectric ceramics , transmission electron microscopy , polarization (electrochemistry) , capacitor , condensed matter physics , optoelectronics , nanotechnology , voltage , electrical engineering , composite material , chemistry , physics , quantum mechanics , engineering
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