Microcalorimetry for High-Resolution X-Ray Spectroscopy
Author(s) -
Stephen Friedrich
Publication year - 2017
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/1342032
Subject(s) - detector , resolution (logic) , gamma spectroscopy , germanium , gamma ray , spectroscopy , materials science , semiconductor detector , nuclear material , x ray spectroscopy , x ray , sensitivity (control systems) , analytical chemistry (journal) , physics , nuclear physics , optics , chemistry , optoelectronics , electronic engineering , silicon , engineering , chromatography , quantum mechanics , artificial intelligence , computer science
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