Open AccessThe Impact of Data Shortfalls on Reliability Uncertainty: Using the Rationale for Assessing Degradation Arriving at Random Methodology
Author(s) -
Michael S. Hamada,
Jeff Abes,
C. R. Hills
Publication year - 2016
Language(s) - English
Resource type - Reports
DOI - 10.2172/1335640
Subject(s) - reliability (semiconductor) , degradation (telecommunications) , cracking , reliability engineering , service life , fragmentation (computing) , process engineering , environmental science , computer science , biological system , materials science , engineering , composite material , thermodynamics , physics , telecommunications , power (physics) , biology , operating system
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