Open AccessThe Impact of Data Shortfalls on Reliability Uncertainty: Using the Rationale for Assessing Degradation Arriving at Random Methodology
Author(s) -
Michael S. Hamada,
Jeff I. Abes,
C. R. Hills
Publication year - 2016
Language(s) - English
Resource type - Reports
DOI - 10.2172/1335640
Subject(s) - reliability (semiconductor) , cracking , degradation (telecommunications) , reliability engineering , service life , fragmentation (computing) , environmental science , process engineering , biological system , computer science , structural engineering , engineering , materials science , composite material , thermodynamics , physics , telecommunications , power (physics) , biology , operating system