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Development of Scanning Ultrafast Electron Microscope Capability.
Author(s) -
Kimberlee C. Collins,
A. Alec Talin,
David W. Chandler,
Joseph R. Michael
Publication year - 2016
Language(s) - English
Resource type - Reports
DOI - 10.2172/1331925
Subject(s) - ultrashort pulse , nanosecond , electron , microscope , scanning electron microscope , optics , materials science , temporal resolution , semiconductor , optoelectronics , nanometre , image resolution , scanning probe microscopy , resolution (logic) , nanotechnology , physics , computer science , laser , artificial intelligence , quantum mechanics

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