Open AccessMATERIALS AND PROCESSES FOR CONTACT RELIABILITY
Author(s) -
L. K. Jones
Publication year - 1962
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/12824178
Subject(s) - reliability (semiconductor) , reliability engineering , computer science , engineering , physics , thermodynamics , power (physics)
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom