Open AccessSilicon Damage Response Function Derivation and Verification: Assessment of Impact on ASTM Standard E722
Author(s) -
K. Russell DePriest
Publication year - 2016
Language(s) - English
Resource type - Reports
DOI - 10.2172/1259547
Subject(s) - radiation damage , fluence , silicon , function (biology) , coding (social sciences) , neutron , computer science , reliability engineering , nuclear engineering , energy (signal processing) , physics , radiation , nuclear physics , mathematics , statistics , engineering , irradiation , optoelectronics , evolutionary biology , biology
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