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Real-Time X-ray Studies of Surface and Thin Film Processes
Author(s) -
Karl Ludwig
Publication year - 2016
Language(s) - English
Resource type - Reports
DOI - 10.2172/1248336
Subject(s) - neutron scattering , neutron , nuclear physics , spectrometer , neutron source , nist , nuclear engineering , physics , environmental science , materials science , engineering , optics , computer science , natural language processing

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