Open AccessGeGI overview for IAEA
Author(s) -
M. Burks
Publication year - 2015
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/1229847
Subject(s) - contamination , residual , image resolution , environmental science , compton scattering , resolution (logic) , pinhole (optics) , full width at half maximum , remote sensing , physics , optics , computer science , geography , artificial intelligence , scattering , ecology , algorithm , biology