Open AccessLarge-Format, Fully-Depleted, Back-Illuminated CMOS Imaging Technology
Author(s) -
Adam F. Lee
Publication year - 2014
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/1221583
Subject(s) - wafer , materials science , optoelectronics , cmos , silicon on insulator , silicon , large format , integrated circuit , detector , electrical engineering , optics , engineering , physics
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