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Response of Simple, Model Systems to Extreme Conditions
Author(s) -
Rodney C. Ewing,
Maik Lang
Publication year - 2015
Language(s) - English
Resource type - Reports
DOI - 10.2172/1209112
Subject(s) - amorphous solid , materials science , ion , stoichiometry , nanotechnology , atom (system on chip) , chemical physics , oxide , synchrotron radiation , irradiation , atomic physics , physics , chemistry , crystallography , optics , nuclear physics , computer science , quantum mechanics , embedded system , metallurgy

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