Projection Microstereolithography for Architected Materials
Author(s) -
Maxim Shusteff
Publication year - 2015
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/1182229
Subject(s) - characterization (materials science) , raman spectroscopy , projection (relational algebra) , materials science , quality (philosophy) , computer graphics (images) , computer science , engineering drawing , structured light 3d scanner , composite material , nanotechnology , engineering , optics , artificial intelligence , physics , algorithm , quantum mechanics , scanner
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