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Advanced Characterization: 3D chemistry and structure at sub-nm resolution
Author(s) -
Paul G. Kotula,
Michael J. Rye
Publication year - 2014
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1172785
Subject(s) - characterization (materials science) , tomographic reconstruction , nanometre , resolution (logic) , microanalysis , tomography , electron tomography , materials science , image resolution , focused ion beam , optics , spectral imaging , dimension (graph theory) , computed tomographic , transmission electron microscopy , physics , computed tomography , computer science , chemistry , ion , scanning transmission electron microscopy , mathematics , artificial intelligence , radiology , medicine , organic chemistry , quantum mechanics , pure mathematics

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