Open AccessDiagnostic for charging and damage of dielectrics in accelerators
Author(s) -
J. L. Hirshfield
Publication year - 2014
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1164914
Subject(s) - reliability (semiconductor) , dielectric , particle accelerator , materials science , particle (ecology) , reliability engineering , nuclear engineering , engineering physics , computer science , nanotechnology , engineering , physics , optoelectronics , structural engineering , quantum mechanics , oceanography , geology , power (physics) , beam (structure)
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