Open AccessWAFER TEST CAVITY -Linking Surface Microstructure to RF Performance: a ‘Short-Sample Test Facility’ for characterizing superconducting materials for SRF cavities.
Author(s) -
Nathaniel Pogue,
Justin Comeaux,
P. McIntyre
Publication year - 2014
Language(s) - English
Resource type - Reports
DOI - 10.2172/1132848
Subject(s) - wafer , sapphire , materials science , wafer testing , scanner , optoelectronics , cavity wall , sample (material) , mechanical engineering , nuclear engineering , optics , composite material , engineering , physics , laser , thermodynamics