Open AccessNeutron-Induced failures in Semiconductor Devices
Author(s) -
S.A. Wender
Publication year - 2014
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/1130508
Subject(s) - neutron , semiconductor , selection (genetic algorithm) , semiconductor detector , nuclear engineering , reliability engineering , materials science , nuclear physics , computer science , medical physics , medicine , optoelectronics , physics , engineering , detector , telecommunications , artificial intelligence
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