Characterization of Structure and Damage in Materials in Four Dimensions
Author(s) -
I. M. Robertson,
Christopher A. Schuh,
J.B. Vetrano,
Nigel D. Browning,
David P. Field,
Dorte Juul Jensen,
Michael E. Miller,
Ian Baker,
David C. Dunand,
Rafal E. DuninBorkowski,
B. Kabius,
Terence Victor George Kelly,
Sergio LozanoPerez,
Amit Misra,
Gregory S. Rohrer,
Anthony D. Rollett,
Mohammad Mahdi Taheri,
G.B. Thompson,
Michael D. Uchic,
Xiqing Wang,
Gary S. Was
Publication year - 2010
Language(s) - English
Resource type - Reports
DOI - 10.2172/1124906
Subject(s) - characterization (materials science) , toolbox , field (mathematics) , computer science , instrumentation (computer programming) , atom probe , nanotechnology , data science , materials science , mathematics , transmission electron microscopy , pure mathematics , programming language , operating system
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