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Characterization of Structure and Damage in Materials in Four Dimensions
Author(s) -
I. M. Robertson,
Carsten Schuh,
J. S. Vetrano,
N Browning,
David P. Field,
D. Juul Jensen,
M.K. Miller,
I. Baker,
David C. Dunand,
Rafal E. DuninBorkowski,
B. Kabius,
Terence Victor George Kelly,
Sergio Lozano-Pérez,
Amit Misra,
Gregory S. Rohrer,
Anthony D. Rollett,
Mahdi Taheri,
GB Thompson,
Michael D. Uchic,
X L Wang,
G. S. Was
Publication year - 2010
Language(s) - English
Resource type - Reports
DOI - 10.2172/1124906
Subject(s) - characterization (materials science) , toolbox , field (mathematics) , computer science , instrumentation (computer programming) , atom probe , nanotechnology , data science , materials science , mathematics , transmission electron microscopy , pure mathematics , programming language , operating system

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