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Safety Calculations for the Flight of Primary and Secondary Fragments
Author(s) -
J. M. McAfee
Publication year - 2012
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1054252
Subject(s) - sputtering , profiling (computer programming) , primary (astronomy) , identification (biology) , materials science , computer science , nanotechnology , physics , operating system , astrophysics , biology , thin film , botany

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