Open AccessThermal Conductivity Measurement of Xe-Implanted Uranium Dioxide Thick Films using Multilayer Laser Flash Analysis
Author(s) -
Andrew T. Nelson
Publication year - 2012
Language(s) - English
Resource type - Reports
DOI - 10.2172/1050011
Subject(s) - uranium dioxide , xenon , materials science , ceramic , uranium , nuclear fuel , depleted uranium , deposition (geology) , silicon carbide , composite material , metallurgy , chemistry , nuclear chemistry , paleontology , organic chemistry , sediment , biology