Open AccessScience of Signatures Workshop on Secondary Ion Mass Spectrometry (SIMS) Applications July 24, 2012
Author(s) -
D. D. Hickmott,
Lee R. Riciputi
Publication year - 2012
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1047099
Subject(s) - explosive material , focus (optics) , accelerator mass spectrometry , secondary ion mass spectrometry , mass spectrometry , physics , geography , archaeology , optics , quantum mechanics
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