Open AccessX-ray diffraction characterization of defect behavior in nanocrystalline nickel during annealing
Author(s) -
J. A. Eastman,
M. A. Beno,
G. S. Knapp,
L. J. Thompson
Publication year - 1994
Language(s) - English
Resource type - Reports
DOI - 10.2172/10194718
Subject(s) - nanocrystalline material , materials science , annealing (glass) , nickel , diffraction , characterization (materials science) , silicide , metal , crystallography , metallurgy , x ray crystallography , nanotechnology , optics , chemistry , silicon , physics